TX 2000 is the state of the art laboratory spectrometer for quantitative multi element trace analysis using Total Reflection X-Ray Fluorescence (TXRF).
TXRF is a type of Energy Dispersive X-Ray Fluorescence (EDXRF) in which the beam strikes the sample, deposited as a thin layer on a carrier, at a very small incidence angle, in order to exploit enhancement given by the total Reflection effect.
TX 2000, equipped with an automatic primary beam switching system (MoKa, WLa/Lb and bremsstrahlung 33 keV), a Silicon Drift Detector (SDD) and an high power X-Ray Tube is the optimal solution for applications in environmental, chemicals and nuclear fields.
TX 2000 Main Features
- TXRF spectroscopy in the same equipment.
- Stepper motors with optical encoders ensure extremely precise angular values.
- Automatic switching of primary beam (MoKa, WLa/Lb and bremsstrahlung 33 keV) using double anode Mo/W X-ray tube, based on innovative software. We select the energy required using an high reflectivity 80% (WLa/Lb/MoKa) multilayer. We can choose also other X-ray tubes and monochromatise the energy that you need.
- Peltier-cooled Silicon Drift Detector with an energy resolution of 124eV FWHM@MnKa (shaping time 1 ms)
- Minimal distance between the sample and the detector (mounted to the axis normal to the plane of the sample).
- Instrumental detection limits for more than 50 elements below 10 pg.
- Helium device to improve the detection limits for the light elements.
- Excellent detection limits (ppt) for a wide range element
- No matrix effect
- Environmental Analysis: water, dust, sediments, aerosol
- Medicine: toxic elements in biological fluids and tissue samples
- Forensic Science: analysis of extremely small sample quantities
- Pure chemicals: acids, bases, salts, solvents, water, ultrapure reagents
- Oils and greases: crude oil, essential oil, fuel oil
- Pigments: ink, oil paints, powder
- Semiconductor Industry: by VPD (vaporphase decomposition)
- Nuclear Industry: measurements of radioactive elements
|X-Ray Generator||Maximum Output Power||3 kW (option: 4 kW)|
|Output Stability||< 0.01 % (for 10% power supply fluctuation)|
|Max Output Voltage||60 kV|
|Max Output Current||60 mA (option: 80 mA)|
|Voltage Step Width||0.1 kV|
|Current Step Width||0.1 mA|
|Ripple||0.03% rms < 1kHz, 0.75% rms > 1kHz|
|Preheat and Ramp||Automatic preheat and ramp control circuit|
|Input Voltage||220 Vac +/-10%, 50 or 60 Hz, single phase|
|Size||Width 48.3 cm, height 13.3 cm, depth 56 cm|
|X-Ray Tube||Type||Glass, Mo/W anode, long fine focus|
|Focus||0.4 x 12 mm|
|Max Output||2.5 kW|
|Automatic Sample||Sample seating||12 for TXRF|
|Detector||Type||Peltier-cooled Silicon Drift Detector (SDD)|
|Active Area||30 mm2 (10, 50 and 100 as options)|
|Energy Resolution||Shaping Time 1 ms|
|Case||Dimensions||Width 550 mm, Heigh 1675 mm, Depth 805 mm|
|Leakage X-Rays||< 1 mSv/Year (full safety shielding according to the international guidelines)|
|Processing Unit||Computer Type||Personal Computer|
|Items Controlled||X-Ray Generator, Tube Shield, Monochromator, Detector, Counting Chain|
|Basic Data Processing||Multisample positioning|
|Counter Chain parameter settings|
|Selection of Radiation|
|K. L & M markers|
|Time or count selection|
|Acquisition of data in TXRF geometry|
|Least Square Marquardt fit procedure for the area calculation|
|Automatic / Manual search Function|
|Automatic / Manual Calibration of Energy|
|Quantification via an internal standard using theoretical and experimental sensitivity curves for total reflection|
Written for Windows 7 is the program designed for the control of the TX 2000 System. It includes some new features, like the batch programming of a set of measurements. The program can control different kinds of detectors and devices attached to the instrument. Control panels for scintillation, linear position sensitive detectors and XRF X-GLAB SDD detector are integrated.
- Least square Marquardt fit procedure for the area calculation (spectral analysis)
- Automatic/manual search function
- Manual or automatic calibration of energy.
- Quantification via an internal standard using theoretical and experimental sensibility curves for total reflection.