TXRF Analysis

An outstanding spectrometer that allows to perform Energy Dispersive X-Ray Fluorescence Analysis in Total Reflection Geometry.


TX 2000

TX 2000 is the state of the art laboratory spectrometer for quantitative multi element trace analysis using Total Reflection X-Ray Fluorescence (TXRF). 

TXRF is a type of Energy Dispersive X-Ray Fluorescence (EDXRF) in which the beam strikes the sample, deposited as a thin layer on a carrier, at a very small incidence angle, in order to exploit enhancement given by the total reflection effect. As far as the sample is thin enough (thin film approximation), the tecnique's main strenghts are:

 - simultaneous multi-element analysis from Na to Pu

 - no matrix effect 

 - no matrix-dependent calibration curves 

 - improved detection limits (LOD) down to ng/g or lower 

 - minimum amount of sample 

 - microanalysis capabilities 

TX 2000, equipped with an automatic primary beam switching system  (MoKa, WLa/Lb and bremsstrahlung 33 keV), a Silicon Drift Detector (SDD) and an high power X-Ray Tube is the optimal solution for applications in environmental, chemicals and nuclear fields. 


TX 2000 Main Features

  • Stepper motors with optical encoders ensure extremely precise angular values.
  • Enhanced excitation mode by selection of the most suitable monochromatized energy (W-La/W-Lb/Mo-Ka) provided by the combination of double anode MO/W X-ray tube and W/Si multilayer. Other X-Ray anodes can be monochromatized as well. 
  • Peltier-cooled Silicon Drift Detector with an energy resolution better than of 133eV (FWHM@MnKa, 1ms peaking time)
  • Minimal distance between the sample and the detector (mounted to the axis normal to the plane of the sample).
  • Instrumental detection limits below ng/g.
  • Helium flux attachment to improve the detection limits for the light elements.
  • No matrix effect
  • Environmental Analysis: water, dust, sediments, aerosol (ISO/TS 18507:2015, ISO 20289:2018)
  • Medical/Pharma: toxic elements in biological fluids and tissue samples, catalyst residues
  • Forensic Science: analysis of extremely small sample quantities
  • Pure chemicals: acids, bases, salts, solvents, water, ultrapure reagents
  • Oils and greases: crude oil, essential oil, fuel oil, gasoline, jet fuel
  • Pigments: ink, oil paints, powder
  • Nuclear Industry: measurements of radioactive elements
X-Ray Generator Maximum Output Power 3 kW (option: 4 kW)
Max Output Voltage 60 kV
Max Output Current 60 mA (option: 80 mA)
Output Stability < 0.01 % (for 10% power supply fluctuation)
Voltage Step Width 0.1 kV
Current Step Width 0.1 mA
Ripple 0.03% rms < 1kHz, 0.75% rms > 1kHz
Preheat and Ramp Automatic preheat and ramp control circuit
Input Voltage 220 Vac +/-10%, 50 or 60 Hz, single phase
X-Ray Tube (*) Type Glass, Mo/W anode, long fine focus
Focus 0.4 x 12 mm
Max Output 2.5 kW
(*) Different anodes can be mounted on request
Multilayer monochromator Type W/Si
Reflectivity 80%
Excitation energies W-La 8.4 keV (DE<1 keV)
W-Lb 9.67 keV (DE<1 keV)
Mo-Ka 17.44 keV (DE<1 keV)
Bremsstrahlung 33 keV
Sample Holder Sample seating 12 for TXRF
Detector Type Peltier-cooled Silicon Drift Detector (SDD)
Active Area 30 mm2 (other sizes available)
Resolution <133 eV (@Mn-Ka, 1ms peaking time)
Atmoshepre Air or He Flux
Case Dimensions Width 580 mm, Height 1631.5 mm, Depth 793 mm
Leakage X-Rays < 1 mSv/Year (full safety shielding according to the international guidelines)
Cooling External Chiller (1146h, 570w, 740d)
Software Acquisition Selection of excitation energy
Measurement batch setup
Detector parameter settings
Analysis Automatic Least Square Marquardt fit procedure for background determination and peak area calculation
Automatic / Manual search Function
Energy calibration refinement
Quantification via an internal standard using theoretical and/or experimental sensitivity curves for total reflection
Possibility of using different sensitivity curves, e.g. sample dependent
Analysis report generation

Acquisition Software 

Written for Windows 7 is the program designed for the control of the TX 2000 System. It includes some new features, like the batch programming of a set of measurements. The program can control different kinds of detectors and devices attached to the instrument. Control panels for scintillation, linear position sensitive detectors and XRF X-GLAB SDD detector are integrated.

Analytical Software

  • Least square Marquardt fit procedure for the area calculation (spectral analysis)
  • Automatic/manual search function
  • Manual or automatic calibration of energy.
  • Quantification via an internal standard using theoretical and experimental sensibility curves for total reflection.


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