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Horizon
Horizon is the new Benchtop Total Reflection X-Ray Fluorescence Spectrometer (TXRF) for multi elemental qualitative and quantitative analyses for major constituents and ultra-trace in suspension as well as liquid samples.
TXRF is a type of Energy Dispersive X-Ray Fluorescence (EDXRF) in which the X-Ray beam strikes the sample, deposited as a thin layer on a carrier, at a very small incident angle, in order to exploit the excitation enhancement given by the total reflection effect. As far as the sample is thin enough (thin film approximation), the technique's main strengts are:
- simultaneous multi-element analysis from Na to Pu
- no matrix effect
- no matrix-dependent calibration curves
- improved detection limits (LOD) down to ng/g or lower
- minimum amount of sample
- microanalysis capabilities
Horizon is the state of the art of the Total Reflection X-Ray Fluorescence spectrometer and it is equipped with all the most modern technical components, which grant accuracy, precision, safety and easiness of use.
It is a powerful tool for trace analysis at an affordable price.
- Environmental Analysis: water, dust, sediments, aerosol (ISO/TS 18507:2015, ISO 20289:2018)
- Medical/Pharma: toxic elements in biological fluids and tissue samples, catalyst residues
- Forensic Science: analysis of extremely small sample of quantities
- Pure chemicals: acids, bases, salts, solvents, water, ultrapure reagents
- Oils and greases: crude oil, essential oil, fuel oil, gasoline, jet fuel
- Pigments: ink, oil paints, powder
- Nuclear Industry: measurements of radioactive elements
Acquisition Software
Written for Windows 7 the program is designed for the control of the Horizon System. It includes some new features, like the batch programming of a set of measurements. The program can control different kinds of detectors and devices attached to the instrument. Control panels for X-ray generator, motors and detectors are integrated.
Analytical Software
- Least square Marquardt fit procedure for the area calculation (spectral analysis)
- Automatic/manual search function
- Manual or automatic calibration of energy
- Quantification via an internal standard using theoretical and experimental sensitivity curves
Registration required
To access website downloads, please register.
| X-Ray Generator | Maximum Output Power | 600 W |
| Max Output Voltage | 40 kV | |
| Max Output Current | 15 mA | |
| X-Ray Tube (*) | Type | Glass, Mo anode, fine focus |
| Focus | 0.4 x 8 mm | |
| Max Output | 600 W (factory maximum: 2.0 kW) | |
| (*) different anodes can be mounted on request | ||
| Multilayer monochromator | Type | W/Si |
| Reflectivity | 80% | |
| Excitation energy | Mo-Ka | 17.44 keV (ΔE<1 KeV) |
| Sample Holder | 12 position sample holder | |
| Detector | Type | Peltier-cooled Silicon Drift Detector (SDD) |
| Active Area | 30 mm² (other sizes available) | |
| Resolution | <133 eV (@Mn-Ka, 1 μs peaking time) | |
| Atmoshere | Air or He flux | |
| Case | Dimensions | Windth 578.5 mm, Height 788.5, Depth 555 mm |
| weight | 110 kg (without chiller) | |
| Leakage X-Rays | < 1 mSv/year (full safety shielding according to the international guidelines) | |
| Cooling | External Chiller (650 (h), 377 (w), 521 (d)) | |
| Software | Acquisition | Measurement batch setup |
| Detector parameter settings | ||
| Analysis | Automatic Least Square Marquardt fit procedure for background determination and peak area calculation | |
| Automatic / Manual search Function | ||
| Energy calibration refinement | ||
| Quantification via an internal standard using theoretical and /or experimental sensitivity curves for total reflection | ||
| Possibility of using different sensitivity curves, e.g. sample dependent | ||
| Analysis report generation |