Horizon, the new TXRF Benchtop spectrometer manufactured by GNR

Horizon

Horizon is the new Benchtop Total Reflection X-Ray Fluorescence Spectrometer (TXRF) for multi elemental qualitative and quantitative analyses for major constituents and ultra-trace in suspension as well as liquid samples. 

TXRF is a type of Energy Dispersive X-Ray Fluorescence (EDXRF) in which the X-Ray beam strikes the sample, deposited as a thin layer on a carrier, at a very small incident angle, in order to exploit the excitation enhancement given by the total reflection effect. As far as the sample is thin enough (thin film approximation), the technique's main strengts are:

 - simultaneous multi-element analysis from Na to Pu 

 - no matrix effect 

 - no matrix-dependent calibration curves 

 - improved detection limits (LOD) down to ng/g or lower 

 - minimum amount of sample 

 - microanalysis capabilities 

Horizon is the state of the art of the Total Reflection X-Ray Fluorescence spectrometer and it is equipped with all the most modern technical components, which grant accuracy, precision, safety and easiness of use. 

It is a powerful tool for trace analysis at an affordable price.  

  • Environmental Analysis: water, dust, sediments, aerosol (ISO/TS 18507:2015, ISO 20289:2018)
  • Medical/Pharma: toxic elements in biological fluids and tissue samples, catalyst residues
  • Forensic Science: analysis of extremely small sample of quantities
  • Pure chemicals: acids, bases, salts, solvents, water, ultrapure reagents
  • Oils and greases: crude oil, essential oil, fuel oil, gasoline, jet fuel
  • Pigments: ink, oil paints, powder
  • Nuclear Industry: measurements of radioactive elements  

Acquisition Software 

Written for Windows 7 is the program designed for the control of the TX 2000 System. It includes some new features, like the batch programming of a set of measurements. The program can control different kinds of detectors and devices attached to the instrument. Control panels for scintillation, linear position sensitive detectors and XRF X-GLAB SDD detector are integrated.

Analytical Software

  • Least square Marquardt fit procedure for the area calculation (spectral analysis)
  • Automatic/manual search function
  • Manual or automatic calibration of energy
  • Quantification via an internal standard using theoretical and experimental sensibility curves for total reflection
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X-Ray Generator Maximum Output Power 600 W
Max Output Voltage 40 kV
Max Output Current 15 mA
X-Ray Tube (*) Type Glass, Mo anode, fine focus
Focus 0.4 x 8 mm
Max Output 600 W (factory maximum: 2.0 kW)
(*) different anodes can be mounted on request
Multilayer monochromator Type W/Si
Reflectivity 80%
Excitation energy Mo-Ka 17.44 keV (DE<1 KeV)
Sample Holder 12 position sample holder
Detector Type Peltier-cooled Silicon Drift Decoder (SDD)
Active Area 30 mm2 (other size available)
Resolution <133 eV (@Mn-Ka, 1 ms peaking time)
Atmoshere Air or He flux
Case Dimensions Windth 578.5 mm, Height 788.5, Depth 555 mm
Leakage X-Rays < 1 mSv/year (full safety shielding according to the international guidelines)
Cooling External Chiller (650 (h), 377 (w), 521 (d))
Software Acquisition Measurement batch setup
Detector parameter settings
Analysis Automatic Least Square Marquardt fit procedure for background determination and peak area calculation
Automatic / Manual search Function
Energy calibration refinement
Quantification via an internal standard using theoretical and /or experimental sensitivity curves for total reflection
Possibility of using different sensitivity curves, e.g. sample dependent
Analysis report generation