TXRF Analysis

An outstanding spectrometer that allows to perform Energy Dispersive X-Ray Fluorescence Analysis in Total Reflection Geometry.


TX 2000

TX 2000 is the state of the art laboratory spectrometer for quantitative multi element trace analysis using Total Reflection X-Ray Fluorescence (TXRF). 

TXRF is a type of Energy Dispersive X-Ray Fluorescence (EDXRF) in which the beam strikes the sample, deposited as a thin layer on a carrier, at a very small incidence angle, in order to exploit enhancement given by the total Reflection effect.

TX 2000, equipped with an automatic primary beam switching system  (MoKa, WLa/Lb and bremsstrahlung 33 keV), a Silicon Drift Detector (SDD) and an high power X-Ray Tube is the optimal solution for applications in environmental, chemicals and nuclear fields. 

TX 2000 Main Features

  • TXRF spectroscopy in the same equipment.
  • Stepper motors with optical encoders ensure extremely precise angular values.
  • Automatic switching of primary beam (MoKa, WLa/Lb and bremsstrahlung 33 keV) using double anode Mo/W X-ray tube, based on innovative software. We select the energy required using an high reflectivity 80% (WLa/Lb/MoKa) multilayer. We can choose also other X-ray tubes and monochromatise the energy that you need.
  • Peltier-cooled Silicon Drift Detector with an energy resolution of 124eV FWHM@MnKa (shaping time 1 ms)
  • Minimal distance between the sample and the detector (mounted to the axis normal to the plane of the sample).
  • Instrumental detection limits for more than 50 elements below 10 pg.
  • Helium device to improve the detection limits for the light elements.
  • Excellent detection limits (ppt) for a wide range element 
  • No matrix effect
  • Environmental Analysis: water, dust, sediments, aerosol
  • Medicine: toxic elements in biological fluids and tissue samples
  • Forensic Science: analysis of extremely small sample quantities
  • Pure chemicals: acids, bases, salts, solvents, water, ultrapure reagents
  • Oils and greases: crude oil, essential oil, fuel oil
  • Pigments: ink, oil paints, powder
  • Semiconductor Industry: by VPD (vaporphase decomposition)
  • Nuclear Industry: measurements of radioactive elements
X-Ray Generator Maximum Output Power 3 kW (option: 4 kW)
Output Stability < 0.01 % (for 10% power supply fluctuation)
Max Output Voltage 60 kV
Max Output Current 60 mA (option: 80 mA)
Voltage Step Width 0.1 kV
Current Step Width 0.1 mA
Ripple 0.03% rms < 1kHz, 0.75% rms > 1kHz
Preheat and Ramp Automatic preheat and ramp control circuit
Input Voltage 220 Vac +/-10%, 50 or 60 Hz, single phase
Size Width 48.3 cm, height 13.3 cm, depth 56 cm
X-Ray Tube Type Glass, Mo/W anode, long fine focus
Focus 0.4 x 12 mm
Max Output 2.5 kW
Multilayer monochromator Type Si/W
Reflectivity 80%
Automatic Sample Sample seating 12 for TXRF
Detector Type Peltier-cooled Silicon Drift Detector (SDD)
Active Area 30 mm2 (10, 50 and 100 as options)
Energy Resolution Shaping Time 1 ms
Preamplifer Type Pulsed-reset charge-preamplifer
Case Dimensions Width 550 mm, Heigh 1675 mm, Depth 805 mm
Leakage X-Rays < 1 mSv/Year (full safety shielding according to the international guidelines)
Processing Unit Computer Type Personal Computer
Items Controlled X-Ray Generator, Tube Shield, Monochromator, Detector, Counting Chain
Basic Data Processing Multisample positioning
Counter Chain parameter settings
Selection of Radiation
Centring procedure
K. L & M markers
Time or count selection
Acquisition of data in TXRF geometry
Least Square Marquardt fit procedure for the area calculation
Automatic / Manual search Function
Automatic / Manual Calibration of Energy
Quantification via an internal standard using theoretical and experimental sensitivity curves for total reflection

Acquisition Software 

Written for Windows 7 is the program designed for the control of the TX 2000 System. It includes some new features, like the batch programming of a set of measurements. The program can control different kinds of detectors and devices attached to the instrument. Control panels for scintillation, linear position sensitive detectors and XRF X-GLAB SDD detector are integrated.

Analytical Software

  • Least square Marquardt fit procedure for the area calculation (spectral analysis)
  • Automatic/manual search function
  • Manual or automatic calibration of energy.
  • Quantification via an internal standard using theoretical and experimental sensibility curves for total reflection.


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