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A. Cinosi, G. Siviero, D. Monticelli, R. Furian, Trace element quantification in light fuels by total reflection X-ray fluorescence spectrometry, Spectrochimica Acta Part B: Atomic Spectroscopy, Volume 164, 2020,105749, https://doi.org/10.1016/j.sab.2019.105749

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D. Monticelli, A. Cinosi, G. Siviero, L. Seralessandri, Trace element determination in soy sauce: A novel total reflection X-ray fluorescence procedure and comparison with inductively coupled plasma–mass spectrometry, Spectrochimica Acta Part B: Atomic Spectroscopy, Volume 146, 2018, Pages 16-20, https://doi.org/10.1016/j.sab.2018.04.022

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G. Siviero, A. Cinosi, D. Monticelli, L. Seralessandri, Determination of trace metals in spirits by total reflection X-ray fluorescence spectrometry, Spectrochimica Acta Part B: Atomic Spectroscopy, Volume 144, 2018, Pages 15-19, https://doi.org/10.1016/j.sab.2018.03.006

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Amedeo Cinosi, Nunzio Andriollo, Francesca Tibaldi, Damiano Monticelli, Atmospheric pressure vapour phase decomposition: A proof of principle, Talanta, Volume 101, 2012, Pages 148-150, ISSN 0039-9140, doi.org/10.1016/j.talanta.2012.09.029

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Cinosi, A., Andriollo, N., Pepponi, G. et al. A novel total reflection X-ray fluorescence procedure for the direct determination of trace elements in petrochemical products. Anal Bioanal Chem 399, 927–933 (2011). doi.org/10.1007/s00216-010-4352-x

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 Ghosh, M, Chavan, TA, Sahoo, S, P. S., RD, Satpati, AK, Swain, KK. Determination of impurities in copper metal using total reflection X‐ray fluorescence spectrometry after matrix separation: Method validation and uncertainty assessment. X‐Ray Spectrom. 2021; 1– 10. doi.org/10.1002/xrs.3228

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Sangita Dhara, N.L. Misra, Elemental characterization of nuclear materials using total reflection X-ray fluorescence spectrometry, TrAC Trends in Analytical Chemistry, Volume 116, 2019, Pages 31-43, ISSN 0165-9936, doi.org/10.1016/j.trac.2019.04.017

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Coccato, A., Vekemans, B., Vincze, L. et al. Pigment particles analysis with a total reflection X-ray fluorescence spectrometer: study of influence of instrumental parameters. Appl. Phys. A 122, 1051 (2016). doi.org/10.1007/s00339-016-0581-y

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Barbra Caballero-Segura, Pedro Ávila-Pérez, Carlos Eduardo Barrera Díaz, Jorge Javier Ramírez García, Graciela Zarazúa, Ricardo Soria & Huemantzin Balan Ortiz-Oliveros (2014) Metal content in mosses from the Metropolitan Area of the Toluca Valley: a comparative study between inductively coupled plasma optical emission spectrometry (ICP-OES) and total reflection X-ray fluorescence spectrometry (TXRF), International Journal of Environmental Analytical Chemistry, 94:13, 1288-1301, DOI: doi.org/10.1080/03067319.2014.940343

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Cantaluppi, C., Natali, M., Ceccotto, F. and Fasson, A. (2013), Multielemental analysis of powder samples by direct measurement with TXRF. X‐Ray Spectrom., 42: 213-219. doi.org/10.1002/xrs.2467

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Sangita Dhara, N.L. Misra, S.D. Maind, Sanjukta A. Kumar, N. Chattopadhyay, S.K. Aggarwal, Forensic application of total reflection X-ray fluorescence spectrometry for elemental characterization of ink samples, Spectrochimica Acta Part B: Atomic Spectroscopy, Volume 65, Issue 2, 2010, Pages 167-170, ISSN 0584-8547, doi.org/10.1016/j.sab.2010.01.004