TXRF and EDXRF in one single equipment

The unique spectrometer that allows to perform Energy Dispersive X-Ray Fluorescence Analysis in both Total Reflection and Traditional (45 degrees) Geometry.

 

TX 2000

TX 2000 is the state of the art laboratory spectrometer for quantitative multi element trace analysis using principles of Total Reflection X-Ray Fluorescence (TXRF). 

TXRF, based on the same principles of traditional X-Ray Fluorescence (XRF), minimizes or totally eliminates matrix effect, allows simoultaneius multi-element ultra-trace analysis and pushes the instrumental detection limit down to ppb range from sodium to plutonium. 

TX 2000, equipped with an automatic primary beam switching system  (MoKa, WLa/Lb and bremsstrahlung 33 keV), a Silicon Drift Detector and an high power X-Ray Tube is the optimal solution for applications in environmentalm chemicals and nuclear fields. 

TX 2000 Main Features

  • TXRF and EDXRF (traditional 45° geometry) spectroscopy in the same equipment.
  • Stepper motors with optical encoders ensure extremely precise angular values.
  • Automatic switching of primary beam (MoKa, WLa/Lb and bremsstrahlung 33 keV) using double anode Mo/W X-ray tube, based on innovative software. We select the energy required using an high reflectivity 80% (WLa/Lb/MoKa) multilayer. We can choose also other X-ray tubes and monochromatise the energy that you need.
  • Peltier-cooled Silicon Drift Detector with an energy resolution of 124eV FWHM@MnKa (shaping time 1 ms)
  • Minimal distance between the sample and the detector (mounted to the axis normal to the plane of the sample).
  • Instrumental detection limits for more than 50 elements below 10 pg.
  • Helium device to improve the detection limits for the light elements.
  • Excellent detection limits (ppt) for a wide range element 
  • No matrix effect
  • Environmental Analysis: water, dust, sediments, aerosol
  • Medicine: toxic elements in biological fluids and tissue samples
  • Forensic Science: analysis of extremely small sample quantities
  • Pure chemicals: acids, bases, salts, solvents, water, ultrapure reagents
  • Oils and greases: crude oil, essential oil, fuel oil
  • Pigments: ink, oil paints, powder
  • Semiconductor Industry: by VPD (vaporphase decomposition)
  • Nuclear Industry: measurements of radioactive elements
X-Ray Generator Maximum Output Power 3 kW (option: 4 kW)
Output Stability < 0.01 % (for 10% power supply fluctuation)
Max Output Voltage 60 kV
Max Output Current 60 mA (option: 80 mA)
Voltage Step Width 0.1 kV
Current Step Width 0.1 mA
Ripple 0.03% rms < 1kHz, 0.75% rms > 1kHz
Preheat and Ramp Automatic preheat and ramp control circuit
Input Voltage 220 Vac +/-10%, 50 or 60 Hz, single phase
Size Width 48.3 cm, height 13.3 cm, depth 56 cm
X-Ray Tube Type Glass, Mo/W anode, long fine focus
Focus 0.4 x 12 mm
Max Output 2.5 kW
Multilayer monochromator Type Si/W
Reflectivity 80%
Automatic Sample Sample seating 12 for TXRF - 1 for EDXRF (45°)
Detector Type Peltier-cooled Silicon Drift Detector (SDD)
Active Area 30 mm2 (10, 50 and 100 as options)
Energy Resolution Shaping Time 1 ms
Preamplifer Type Pulsed-reset charge-preamplifer
Case Dimensions Width 550 mm, Heigh 1675 mm, Depth 805 mm
Leakage X-Rays < 1 mSv/Year (full safety shielding according to the international guidelines)
Processing Unit Computer Type Personal Computer
Items Controlled X-Ray Generator, Tube Shield, Monochromator, Detector, Counting Chain
Basic Data Processing Multisample positioning
Counter Chain parameter settings
Selection of Radiation
Centring procedure
K. L & M markers
Time or count selection
Acquisition of data in both geometries (TXRF - EDXRF)
Least Square Marquardt fit procedure for the area calculation
Automatic / Manual search Function
Automatic / Manual Calibration of Energy
Quantification via an internal standard using theoretical and experimental sensitivity curves for total reflection

Acquisition Software 

Written for Windows 7 is the program designed for the control of the TX 2000 System. It includes some new features, like the batch programming of a set of measurements. The program can control different kinds of detectors and devices attached to the instrument. Control panels for scintillation, linear position sensitive detectors and XRF X-GLAB SDD detector are integrated.

Analytical Software

  • Least square Marquardt fit procedure for the area calculation (spectral analysis)
  • Automatic/manual search function
  • Manual or automatic calibration of energy.
  • Quantification via an internal standard using theoretical and experimental sensibility curves for total reflection.

 

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