Benchtop X-Ray Diffractometer
Europe 600 is a benchtop general purpose diffractometer for XRD qualitative and quantitative analysis of polycrystalline materials. It is available in two different version, with Theta/2Theta goniometer and with the new Theta/Theta goniometer manufactured by GNR.
Its compact size and robust design enables installation and operations in a small space and low cost of ownership and maintenance.
Thanks to the wide offer of configurations and accessories, such as high speed detector, scintillation counter, secondary monochromator, spinner and multiple sample holder, Europe 600 is the perfect instrument for fast-paced routine industrial quality assurance analysis and for teaching XRD at academic level.
Europe operating at 600 watts enables faster analysis and oustanding overall results.
- Ultra Compact
- Theta/2Theta and Theta/Theta oustanding goniometer
- Fail Safe Radiation Enclosure
- Fast Detector available
- Incident Beam Variable Slit
- Simple installation and easy of use
Qualitative and quantitative phase analysis, non-ambient analysis, retained austenite quantification, structure solution and refinement, crystallite size and crystallinity calculations.
- Geology and Mineralogy / Clays
- Glass / Ceramics / Cement
- Chemicals / Petrochemicals
- Catalyst / Polymers
- Agricultural Sciences
- Biosciences / Environmental
- Art and Archeology
|X Ray Generator||Maximum Output Power||600 W (option: 300 W)|
|Output Stability||≤25ppm/hr after a 2 hour warm up|
|Max Output Voltage||40 kV (option: 30 kV)|
|Max Output Current||15 mA (option: 10 mA)|
|Voltage Step Width||0.1 kV|
|Current Step Width||0.1 mA|
|Ripple||≤1%rms at >20 kHz, 0.1%rms below 20 kHz|
|Preheat and Ramp||Automatic preheat and ramp control circuit|
|Input Voltage||230 Vac +/-10%, 50 or 60 Hz, single phase|
|X-Ray Tube||Type||Glass (option: Ceramic), Cu Anode, Fine Focus (options: any kind of X-Ray tube)|
|Focus||0.4 x 8 mm LFF (other options available)|
|Max Output||600 kW|
|Goniometer||Configurations||Vertical Theta/2Theta geometry|
|Measuring circle diameters||150 mm|
|Vertical Scanning Angular Range||- 5° < 2 Theta < + 145° (according to accessories)|
|Smallest selectable stepsize||0.005°|
|Angular reproducibility||+/- 0.001°|
|Modes of operation||Continuous scan, step scan, theta or 2 theta scan, fast scan|
|Variable Divergence slits||0 - 4°|
|Variable Anti-Divergence slits||0 - 4°|
|Variable Receiver slits||0 - 4°|
|Detector||Type||Scintillation counter Nal (options: YAP(Ce); multistrip)|
|Count rate||10(5) cps (Nal); 2 x 10(7) cps (Yap(Ce))|
|Case||Dimensions||Width 600 mm, heigh 750 mm, depth 500 mm|
|Leakage X-rays||< 1 mSv/Year (full safety shielding according to the international guidelines)|
|Processing Unit||Computer Type||Personal Computer, the latest version|
|Items controlled||X-ray generator, goniometer, sample holder, detector|
|Basic Data Processing||Polynomial least squares smoothing. Fourier smoothing. Search for Peaks (automatic and manual). Spline background subtraction. Single peak analysis (area, FWHM, centroid, background). Marquardt fit (with pseudo-Voigt and Pearson VII curves, Ka2 contribution, weighted sum of squares). Sum and multiply by a constant. Scale normalization. Zoom. Graphical windows. Overlap and comparison of diffractograms. Multiview function. Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples. Qualitative and quantitative phase analysis. Rietveld analysis, crystalline structural analysis, crystallite size and lattice strain, crystallinity calculation|
Data Collection Programs
GNR offers a large variety of acquisition programs, for standard as well as for customized hardware configurations. the list includes programs for powder and high resolution diffractometers, retained austenite, data acquisition of stress (plane and triaxial) and thin films (XRD and GIXRD).
Single peak analysis; peak treatment. Background subtraction, smoothing, deconvolution and peak localisation. Structural Analysis, Crystallite Size, Lattice Strain, Reflectometry, Quantitative Analysis.
Search and Match: MATCH!
Rietveld refinement, Display and compare multiple diffraction partners, Directly view specific phases/entries, instant usage of additional information, saving of selection criteria, Comfortable definition of background, Improved zooming facilities, Batch processing and Automatics.